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Digital Electronics Trainer Kit Vocational Training Equipment Didactic Microprocessor Training Equipment

Item No.: AFE5008
Digital Electronics Trainer Kit Vocational Training Equipment Didactic Microprocessor Training Equipment
Description
AFE5008 Digital Electronics Trainer Kit Vocational Training Equipment Didactic Microprocessor Training Equipment
Product introduction:
Device adopts gilded hole, the machine all devices in the negative, positive printing characters of attachment, all the circuit such as signal source frequency meter is made up of CPLD chip and double panel, selects the superior high quality products, all devices are making the quality of the whole experiment box was improved. Due to no positive elements, thus can effectively reduce and avoid the possibility of artificial damage, the machine features: easy to use, durable, flexible experimental project, easy to do digital simulation experiments.

This learning machine is suitable for the colleges and universities and all kinds of electronic technology teaching of vocational and technical schools.
(1) power supply: ac input: 220 v + 10%, 50 Hz
Dc output: + 12 v / 300 ma, 5 v / 3 a rostrum are automatic protection function
(2) manual single pulse circuit of two groups: each group can output plus or minus two pulses at the same time, pulse amplitude for TTL level.
(3) function signal generator can be output: square wave, sine wave, triangular wave. Can reach 0 and 1 m continuous adjustable;Fixed frequency pulse source no.6:1 Hz, 10 Hz and 100 Hz, 1 KHz, 10 KHz, 100 KHz; (composed of CPLD chip)
(4) six high accuracy digital frequency meter, measuring range: 0-9.9999 MHz error < 1 Hz (composed of CPLD chip)
(5) logic level input and display:
A, 16 independent logic level switch: can output "0", "1" level (for positive logic).
B, 16 composed of red leds and driver circuit logic level display circuit.
C, logical pen (can be between 0 to 5 v continuous change color)

Do recommend experimental project
1. TTL integrated logical gate parameters test and use
2. Tests of CMOS integrated logical gate
3. The gate the logic function of the experiment
4. Common combined logic function device test
5. A half adder, full adder and logic operation experiment
6, seven people voting circuit and blood type detection circuit
7, RS trigger function test
8, JK, D trigger logic function and main parameters of the test